A model for wheat yield prediction based on real-time monitoring of environmental factors
- Dumont, B. , Lebeau, F. , Vancutsem, F. , Moureaux, C. , Bodson, B. , Destain, J. & Destain, M. (2010). A model for wheat yield prediction based on real-time monitoring of environmental factors. Proceedings in: The 10th International Conference on Precision Agriculture (ICPA), Denver. Colorado. USA, 18-21/07/2010,
| Type | Conference Proceedings |
| Year of conference | 2010 |
| Title | A model for wheat yield prediction based on real-time monitoring of environmental factors |
| Conference name | The 10th International Conference on Precision Agriculture (ICPA) |
| Conference location | Denver. Colorado. USA |
| Recnumber | 157 |
| conference Date | 18-21/07/2010 |
| Fichier | |
| Authors | Dumont, B., Lebeau, F., Vancutsem, F., Moureaux, C., Bodson, B., Destain, J., Destain, M. |
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