A model for wheat yield prediction based on real-time monitoring of environmental factors


  • Dumont, B. , Lebeau, F. , Vancutsem, F. , Moureaux, C. , Bodson, B. , Destain, J. & Destain, M. (2010). A model for wheat yield prediction based on real-time monitoring of environmental factors. Proceedings in: The 10th International Conference on Precision Agriculture (ICPA), Denver. Colorado. USA, 18-21/07/2010,
Type Conference Proceedings
Year of conference 2010
Title A model for wheat yield prediction based on real-time monitoring of environmental factors
Conference name The 10th International Conference on Precision Agriculture (ICPA)
Conference location Denver. Colorado. USA
Recnumber 157
conference Date 18-21/07/2010
Authors Dumont, B. , Lebeau, F. , Vancutsem, F. , Moureaux, C. , Bodson, B. , Destain, J. & Destain, M.